Composition and strain in thin Si1−xGex virtual substrates measured by micro-Raman spectroscopy and x-ray diffraction
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چکیده
by micro-Raman spectroscopy and x-ray diffraction T. S. Perova, J. Wasyluk, K. Lyutovich, E. Kasper, M. Oehme, K. Rode, and A. Waldron Department of Electronic and Electrical Engineering, Trinity College, University of Dublin, Dublin 2, Ireland Institut für Halbleitertechnik, Universität Stuttgart, Pfaffenwaldring 47, 70569 Stuttgart, Germany School of Physics, CRANN, Trinity College, University of Dublin, Dublin 2, Ireland
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تاریخ انتشار 2011